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This part of series DIN EN 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
Author | VDE |
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Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 31.080.01 : Semiconductor devices in general
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Number of pages | 59 |
Replace | DIN EN 60749-26 (2014-09) |
Cross references | EN IEC 60749-26 (2018-03), IDT |
Weight(kg.) | 0.2003 |
Year | 2018 |
Document history | DIN EN IEC 60749-26 (2018-10) |
Country | Germany |
Keyword | DIN EN IEC 60749;EN IEC 60749;EN IEC 60749-26;60749 |