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DIN EN IEC 60749-26 VDE 0884-749-26:2018-10

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DIN EN IEC 60749-26 VDE 0884-749-26:2018-10

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) (IEC 60749-26:2018); German version EN IEC 60749-26:2018

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This part of series DIN EN 60749 establishes the procedure for testing, evaluating, and classifying components and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).

Author VDE
Editor VDE
Document type Standard
Format Paper
ICS 31.080.01 : Semiconductor devices in general
Number of pages 59
Replace DIN EN 60749-26 (2014-09)
Cross references EN IEC 60749-26 (2018-03), IDT
Weight(kg.) 0.2003
Year 2018
Document history DIN EN IEC 60749-26 (2018-10)
Country Germany
Keyword DIN EN IEC 60749;EN IEC 60749;EN IEC 60749-26;60749