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DIN EN 62433-6 VDE 0847-33-6:2017-11
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DIN EN 62433-6 VDE 0847-33-6:2017-11
EMC IC modelling - Part 6: Models of integrated circuits for Pulse immunity behavioural simulation - Conducted Pulse Immunity (ICIM-CPI) (IEC 47A/1019/CD:2017)This product is no longer in stock
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The objective of this part of DIN EN 62433 (VDE 0847-33) standard is to provide a flow for deriving a macro-model to allow the simulation of the conducted transient immunity of an Integrated Circuit (IC) to pulses such as Electrostatic Discharge (ESD) and Electric Fast Transient (EFT).
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Draft |
| Format | Paper |
| expiration_de_validite | 2017-12-27 |
| ICS | 31.200 : Integrated circuits. Microelectronics
33.100.20 : Immunity |
| Number of pages | 103 |
| Cross references | IEC 47A/1019/CD (2017-05), IDT |
| Weight(kg.) | 0.2751 |
| Year | 2017 |
| Document history | |
| Country | Germany |
| Keyword | DIN EN 62433;EN 62433;EN 62433-6;62433 |