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This document specifies test and measurement methods, test conditions, test setups, test procedures, failure criteria and test signals for the EMC evaluation of ICs with integrated LIN transceivers concerning disturbances on signal and voltage supply lines.
Author | VDE |
---|---|
Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 31.200 : Integrated circuits. Microelectronics
33.100.20 : Immunity |
Number of pages | 48 |
Replace | DIN EN 62228-2 (2015-02) |
Cross references | EN 62228-2 (2017-02), IDT |
Weight(kg.) | 0.1816 |
Year | 2017 |
Document history | DIN EN 62228-2 (2017-09) |
Country | Germany |
Keyword | DIN EN 62228;EN 62228;EN 62228-2;62228 |