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DIN EN 62779-2 VDE 0884-79-2:2017-01

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DIN EN 62779-2 VDE 0884-79-2:2017-01

Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances (IEC 62779-2:2016); German version EN 62779-2:2016

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This part of DIN EN 62779 (VDE 0884-79) defines a measurement method on electrical performances of an electrode that composes a semiconductor interface for human body communication (HBC). It includes general and functional specifications of the measurement method.

Author VDE
Editor VDE
Document type Standard
Format Paper
ICS 31.080.01 : Semiconductor devices in general
Number of pages 20
Replace DIN EN 62779-2 (2013-01)
Cross references EN 62779-2 (2016-05), IDT
Weight(kg.) 0.1340
Year 2017
Document history DIN EN 62779-2 (2017-01)
Country Germany
Keyword DIN EN 62779;EN 62779;EN 62779-2;62779