New product
This product is no longer in stock
Warning: Last items in stock!
Availability date:
This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit (IC). This method provides a mapping of the electric or magnetic near-field emissions over the IC and is intended for use up to 6 GHz.
Author | VDE |
---|---|
Editor | VDE |
Document type | Standard |
Format | Paper |
ICS | 31.200 : Integrated circuits. Microelectronics
|
Number of pages | 32 |
Replace | DIN IEC/TS 61967-3 (2012-05) |
Cross references | IEC/TS 61967-3 (2014-08), IDT |
Weight(kg.) | 0.1544 |
Year | 2015 |
Document history | DIN IEC/TS 61967-3 (2015-08) |
Country | Germany |
Keyword | DIN IEC/TS 61967;61967 |