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DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08
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DIN IEC/TS 62132-9 VDE V 0847-22-9:2015-08
Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)This product is no longer in stock
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This part of IEC 62132 provides a test procedure, which defines a method for evaluating the effect of near electric, magnetic or electromagnetic field components on an integrated circuit (IC). This diagnostic procedure is intended for IC architectural analysis such as floor planning and power distribution optimization.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 26 |
| Replace | DIN IEC/TS 62132-9 (2012-11) |
| Cross references | IEC/TS 62132-9 (2014-08), IDT
|
| Weight(kg.) | 0.1442 |
| Year | 2015 |
| Document history | DIN IEC/TS 62132-9 (2015-08) |
| Country | Germany |
| Keyword | DIN IEC/TS 62132;DIN 62132;62132 |