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DIN EN 62215-3 VDE 0847-23-3:2014-04
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DIN EN 62215-3 VDE 0847-23-3:2014-04
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 62215-3:2013); German version EN 62215-3:2013This product is no longer in stock
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This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 31.200 : Integrated circuits. Microelectronics
|
| Number of pages | 35 |
| Replace | DIN IEC 62215-3 (2010-05) |
| Cross references | EN 62215-3 (2013-10), IDT |
| Weight(kg.) | 0.1595 |
| Year | 2014 |
| Document history | DIN EN 62215-3 (2014-04) |
| Country | Germany |
| Keyword | DIN EN 62215;EN 62215;EN 62215-3;62215 |