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DIN EN 61788-15 VDE 0390-15:2012-08
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DIN EN 61788-15 VDE 0390-15:2012-08
Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies (IEC 61788-15:2011); German version EN 61788-15:2011This product is no longer in stock
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This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13, 14]. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequency f0.
| Author | VDE |
|---|---|
| Editor | VDE |
| Document type | Standard |
| Format | Paper |
| ICS | 29.050 : Superconductivity and conducting materials
|
| Number of pages | 48 |
| Replace | DIN IEC 61788-15 (2009-01) |
| Cross references | EN 61788-15 (2011-12), IDT |
| Weight(kg.) | 0.1816 |
| Year | 2012 |
| Document history | DIN EN 61788-15 (2012-08) |
| Country | Germany |
| Keyword | DIN EN 61788;EN 61788;EN 61788-15;61788 |