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DIN EN 62132-2 VDE 0847-22-2:2011-07

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DIN EN 62132-2 VDE 0847-22-2:2011-07

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method (IEC 62132-2:2010); German version EN 62132-2:2011

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This document specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the charcteristics of the TEM cell.

Author VDE
Editor VDE
Document type Standard
Format Paper
ICS 31.200 : Integrated circuits. Microelectronics
Number of pages 28
Replace DIN IEC 62132-2 (2006-08)
Cross references EN 62132-2 (2011-03), IDT
Weight(kg.) 0.1476
Year 2011
Document history DIN EN 62132-2 (2011-07)
Country Germany
Keyword DIN EN 62132;EN 62132;EN 62132-2;62132