> AS ISO 14606-2006
Sale! View larger

AS ISO 14606-2006

New product

AS ISO 14606-2006 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials

standard by Standards Australia, 01/01/2006

More details

$41.43

-50%

$82.85

More info

Full Description

Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.

Product Details

Published: 01/01/2006File Size: 1 file , 350 KB